Multiscale analyses and characterizations of surface topographies
Publié le -
CIRP Annals - Manufacturing Technology
Auteurs :
Christopher Brown, Hans Hansen, Xiang Jane Jiang, François Blateyron, Johan Berglund, Nicola Senin, Tomasz Bartkowiak, Barnali Dixon, Gaëtan Le Goïc, Yann Quinsat, W. James Stemp, Mary Kathryn Thompson, Peter Ungar, E. Hassan Zahouani